Probe Card

We provide a comprehensive range of high-performance probe cards
and probe heads designed to act as the critical interface between test equipment
and semiconductor wafers. Our solutions support diverse validation and mass production requirements,
offering advanced Vertical Probe Cards and integrated probe head assemblies for high-density
testing that minimize pad damage and improve parallelism.

For cost-effective reliability, we specialize in Cantilever Probe Cards and
specialized configurations engineered to ensure stable contact and efficient oxide breakthrough.
Our lineup also includes specialized High-Frequency solutions, such as shielded and integrated coaxial probes,
designed to maintain superior signal integrity for fine-pitch requirements.
These high-frequency systems are engineered to achieve reliable contact and stable measurement results even
in demanding environments. By leveraging our deep technical expertise and integrated production capabilities,
we ensure every probe card and probe head is optimized for maximum reliability and electrical performance