Manual Probing Solutions

Our manual probe systems provide a versatile solution for engineers performing critical reliability
and performance evaluations within design and validation centers.
We offer platforms that support everything from chip-level testing to 12-inch wafer analysis.
These systems deliver the high stability required for sensitive low-level IV and CV measurements ,
as well as high-power testing up to 20kV and 200A.+4
Our platforms feature an air-bearing design for rapid positioning and micrometers for fine alignment to ensure reliable contact. To facilitate testing under extreme environments, we provide integrated thermal chucks with a wide operating range from -60℃ to + 350℃. With options for shielded dark boxes and vacuum environments, our probers deliver the low-noise conditions essential for verifying next-generation semiconductor designs