Spring Contact Probe

Wafer Process

RIKA DENSHI CO., LTD.

High-Performance Contact Probe Solutions

概要

High-Performance Probe Card and Probe Head Solutions

We provide a comprehensive contact probes designed to serve as a versatile solution for e
ngineers performing critical reliability and performance evaluations,
supporting every phase from initial design to mass production.
Our technology is highly adaptable, offering products that are customizable on over 1,000 specifications
to meet the unique requirements of any testing application.

We specialize in advanced probing architectures, including Kelvin and coaxial Kelvin probes for precision power testing,
as well as ultra-fine-pitch solutions for high-density inspections.
For specialized validation, our lineup includes high-frequency probes optimized for signal integrity in RF environments
and heat-resistant “Dragon Probes” designed for stable measurement at elevated temperatures.
By leveraging proprietary plating technologies and high-performance alloy materials, we ensure our probes deliver the reliability
and electrical performance essential for verifying the next generation of semiconductor designs.

Dragon Probe
Falcon Probe
Long High Frequency Probe
Fine Pitch Probe
Kelvin Probe
Smart Probe
Non-magnetic Probe